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ESD/Latch-up Test Contract Service

ESD/Latch-up Test Contract Service

We provide testing services to evaluate the resistance to ESD damage and latch-up damage, which are important for the reliability of semiconductor devices and electronic components that include them. ■ We accommodate products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We offer tests in accordance with standards such as JEDEC, EIAJ, and ESDA. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with resistance, we assist with failure analysis and problem resolution.

  • Electrical Equipment Testing
  • Other analytical equipment

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Latch-up test contract service

We provide latch-up test services to evaluate the resistance of CMOS ICs and semiconductor products containing them to latch-up destruction.

■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as JEDEC, JEITA, and AEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and root cause investigation to resolve the problem.

  • Analysis and prediction system

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ESD (HBM・MM) Testing Contract Service

We provide testing services to evaluate the resistance to ESD (electrostatic discharge), which is important for the reliability of semiconductor products and electronic components that contain them.

■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and problem resolution.

  • Other analytical equipment

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ESD (CDM) testing outsourcing service

We provide testing services to evaluate the resistance of the Charged Device Model (CDM) to ESD.

■ We will support each specification waveform for JEDEC, JEITA (EIAJ), and AEC through unit replacement. ■ We support both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ The contact state confirmation function of the applied pins ensures reliable application. ■ Destruction judgment support is also possible using diode characteristic judgment methods (consultation required).

  • Other analytical equipment
  • Analysis and prediction system

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ESD (CDM) Testing Contract Service

Reliable application through the contact confirmation function of the applied pin! Compatible with direct charging method and electric field induction method.

The "ESD (CDM) Testing Contract Service" evaluates the resistance of semiconductor products and electronic components, which are crucial for reliability, to damage caused by ESD in device charging models. It supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). Additionally, it is possible to determine damage through diode characteristic evaluation methods and other characteristic assessments (using separate equipment). 【Features】 ■ Compatible with various standard conditions such as JEDEC, JEITA (EIAJ also acceptable), and AEC through unit replacement. ■ Supports both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ Also complies with AEC-Q100-011 for Direct Charge Method and Field Induced Method. ■ Damage determination is also possible through diode characteristic evaluation methods and other characteristic assessments. ■ Ensures reliable application through contact confirmation functions for applied pins. *For more details, please refer to the PDF materials or feel free to contact us.

  • Other analytical equipment

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ESD (HBM・MM) Test Contract Service

From DUT board production to testing! We will propose and conduct tests according to your requests and objectives.

The "ESD (HBM・MM) Testing Service" evaluates the resistance to damage caused by ESD (Electrostatic Discharge) using the Human Body Model and Machine Model, which are important for the reliability of semiconductor products and electronic components that include them. We support products such as IC modules, semiconductor products, and subsystems with up to 512 pins. We conduct tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. Additionally, if there are issues with resistance, we assist in problem-solving, including failure analysis and root cause investigation. 【Features】 ■ Supports products such as IC modules, semiconductor products, and subsystems with up to 512 pins ■ Partial support for products with more than 512 pins (consultation required) ■ Conducts tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC ■ Proposes and conducts tests based on customer requests and objectives ■ Assists in problem-solving, including failure analysis and root cause investigation, if there are issues with resistance *For more details, please refer to the PDF materials or feel free to contact us.

  • Analysis and prediction system

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